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Electronics
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Project Number 1
Summary:
Lab has identified several products capable of removing the different contaminants.Test Objective:
To eliminate the use of TolueneProduct Use:
substrates for semiconductorsTrial Number | Date Run | Purpose | Success Rating |
---|---|---|---|
0 | 08/07/2001 | To identify a replacement cleaner for toluene to remove wax | Preliminary compatibility tests on substrate coupons encouraging for at least one cleaning chemistry. More in-depth laboratory testing necessary. |
1 | 08/08/2001 | To clean supplied parts using two successful cleaners. | A follow up test, usually based on company input. |
2 | 08/13/2001 | To identify alternatives for second contaminant (509) | Results successful using TACT (time, agitation, concentration, and temperature, as well as rinsing and drying) and/or other cleaning chemistries examined. |
3 | 08/15/2001 | Further evaluation of replacements in removing the 509 crystalbond. | A follow up test, usually based on company input. |
4 | 08/23/2001 | Evaluating cleaners for removal of 590 adhesive. | Results successful using TACT (time, agitation, concentration, and temperature, as well as rinsing and drying) and/or other cleaning chemistries examined. |
5 | 08/28/2001 | Evaluating additional cleaners for removal of reed wax. | Results successful using TACT (time, agitation, concentration, and temperature, as well as rinsing and drying) and/or other cleaning chemistries examined. |
6 | 08/28/2001 | Evaluating additional cleaners for removal of reed wax. | A follow up test, usually based on company input. |
7 | 09/19/2001 | Evaluating cleaners for removal. | Results successful using TACT (time, agitation, concentration, and temperature, as well as rinsing and drying) and/or other cleaning chemistries examined. |
8 | 09/20/2001 | Evaluating cleaners for removal. | A follow up test, usually based on company input. |
9 | 10/01/2001 | Evaluating cleaners for removal. | A follow up test, usually based on company input. |
10 | 10/09/2001 | Summary of Findings | Final Report only. |
11 | 10/15/2001 | To evaluate to additional cleaners on all five contaminants | A follow up test, usually based on company input. |
Project Number 2
Summary:
Using FT-IR, the contamination has been identified as being toluene and/or the wax.Test Objective:
To identify contaminants on rejected parts.Product Use:
substrates for semiconductorsTrial Number | Date Run | Purpose | Success Rating |
---|---|---|---|
0 | 08/29/2001 | To identify contaminants on rejected parts. | A cleanliness study, addressing only various analytical techniques. |